| 000 | 00599 a2200217 4500 | ||
|---|---|---|---|
| 003 | GCWUF | ||
| 005 | 20191031223032.0 | ||
| 008 | 191031b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780471739067 | ||
| 040 |
_beng _cMAIN |
||
| 082 |
_a621.38152 _bSCH |
||
| 100 |
_aSchroder, Dieter K. _92220 |
||
| 245 | _aSemiconductor Materials and Device Characteriza/ | ||
| 250 | _a3rd ed. | ||
| 260 |
_aCanada : _bWiley, _c2006. |
||
| 300 |
_axv,779 p. : _bill ; _c26 cm. _fH.B. |
||
| 500 | _aInclude Index | ||
| 650 |
_aSemiconductors _92221 |
||
| 650 |
_aSemiconductors--Testing _92222 |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c10098 _d10098 |
||